Physical properties are assuming an increasingly pivotal role in various industries, especially in the realm of thin film applications. These applications span a wide array of technologies, including phase-change materials, optical disk media, thermoelectric materials, light-emitting diodes (LEDs), fuel cells, phase-change memories, flat panel displays, and the broader semiconductor industry.

To effectively evaluate the compatibility and efficiency of thin film technology for specific applications, a range of measurement principles has been developed over time. These principles have served as the foundation for the creation of specialized measuring instruments.

Traditionally, materials research has predominantly focused on macroscopic samples, often referred to as bulk samples. Consequently, the initial development of measurement devices was primarily geared toward solid materials. However, given the distinctive characteristics of nanostructured samples, a different metrology approach is required to adequately characterize them.